Product Categories
Static parameter test systems and curve tracers for diodes, transistors, MOSFETs, IGBTs and other discrete devices.

STI 5000E Discrete Parametric Tester
Parametric and Curve Tracing Testers

STI 5000C and 5300C IV Curve Tracer
Parametric and Curve Tracing Testers

ST5300HX Discrete Device Test System
Parametric and Curve Tracing Testers

STI5300C Discrete Test System
Parametric and Curve Tracing Testers

Tektronix 370B Curve Tracer
Parametric and Curve Tracing Testers

IST870 and IST878 Handheld Device Testers
Parametric and Curve Tracing Testers

Discrete Device Tester
Parametric and Curve Tracing Testers
Switching time, gate charge, Trr/Qrr and UIS/EAS avalanche test systems for power devices.

ipTEST Static and Dynamic Discrete Testers
Dynamic Parameter and Avalanche Testers

ITC57300 Dynamic Parameter Test System
Dynamic Parameter and Avalanche Testers

ITC55100C UIS and EAS Avalanche Tester
Dynamic Parameter and Avalanche Testers

UIS / UIL Avalanche Tester
Dynamic Parameter and Avalanche Testers

SX5012 5000 V 1200 A IGBT Test System
Dynamic Parameter and Avalanche Testers
Array spectrometers and imaging colorimeters from Instrument Systems for LED, display and light source measurement.
Junction-to-case thermal resistance analysers and thermal imaging cameras for device and board level work.
Computer controlled network analysers for quartz crystal and ceramic resonator measurement.
Small aperture curved surface gloss measurement to ISO 2813 and ASTM D523.
Pin and output programmable scanners, high current decks, low current decks and custom test fixtures.

ADP401A Pin Programmable Scanner
Scanners Decks and Fixtures

Model 6010 Output Programmable Scanner
Scanners Decks and Fixtures

HC-500 HC-1000 and HC-1200 High Current Decks
Scanners Decks and Fixtures

LC-1000 Low Current Deck
Scanners Decks and Fixtures

STI5300C Test Fixtures
Scanners Decks and Fixtures

ADP-360OVP
Scanners Decks and Fixtures

TO-220
Scanners Decks and Fixtures
Repair, calibration, handler connection and outsourced device parameter testing.
Shanghai JLC brings first class test instruments from Europe, the USA, Korea and Japan to Chinese device makers, and backs them with repair, calibration and outsourced testing.