Parametric and Curve Tracing Testers
High speed multipurpose intelligent test system for discrete semiconductors.
Overview
The 5000C is a high speed multipurpose intelligent test system for discrete semiconductors, built on an Intel based SBC with Windows based software. The testers are reliable, fast and straightforward to operate.
A six step MOSFET test program (VGSTHB, VDSSR, RDSON2, VGSON and GFS calculation) takes approximately 6 milliseconds to run, giving a throughput of up to 37,440 devices per hour.
The system carries a large programming software library and can test 19 device families covering 27 sub-classes of low, medium and high power discrete devices.
Specifications
Devices Covered
FAQ
Configuration decides both. Tell us the device, the package and the parameters you need and our engineers will confirm the configuration, the price and the delivery time.
Yes. Contact our sales engineers to arrange a demonstration or a trial measurement of your own device.
Yes. Installation, training, calibration and repair are handled by our own engineers in China.
High speed multipurpose intelligent test system for discrete semiconductors.
