Product Categories
Switching time, gate charge, Trr/Qrr and UIS/EAS avalanche test systems for power devices.

ipTEST Static and Dynamic Discrete Testers
Dynamic Parameter and Avalanche Testers

ITC57300 Dynamic Parameter Test System
Dynamic Parameter and Avalanche Testers

ITC55100C UIS and EAS Avalanche Tester
Dynamic Parameter and Avalanche Testers

UIS / UIL Avalanche Tester
Dynamic Parameter and Avalanche Testers

SX5012 5000 V 1200 A IGBT Test System
Dynamic Parameter and Avalanche Testers
FAQ
Yes. Tell us the device type, the package, the parameters you need and the throughput you are aiming for, and our engineers will propose the system and the fixtures that fit.
Yes. Fixtures are made to order against the real dimensions of your device. With our STI5300C fixtures the lowest measured RDSON value can reach below 1 mOhm.
We repair and calibrate the types of semiconductor tester and handler that are common in the market, including STI5000E, STI5000C, STI5300HX and STI5300C, and we can carry out handler connection projects on site.
Switching time, gate charge, Trr/Qrr and UIS/EAS avalanche test systems for power devices.